Sogoyan, A. V.: search on Z-Library

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1

IC’s radiation effects modeling and estimation

V.V Belyakov, A.I Chumakov, A.Y Nikiforov, V.S Pershenkov, P.K Skorobogatov, A.V Sogoyan

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 358 KB

english, 2000

2

Interaction of IR laser radiation with periodic metal surfaces

A. Karabutov, M. Sogoyan

Journal:

Infrared Physics & Technology

Year:

1995

Language:

english

File:

PDF, 1.45 MB

english, 1995

3

Modeling the field and thermal dependence of radiation-induced charge annealing in MOS devices

Emelianov, V.V., Sogoyan, A.V., Meshurov, O.V., Ulimov, V.N., Pershenkov, V.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1996

Language:

english

File:

PDF, 787 KB

english, 1996

4

SEE rate estimation based on diffusion approximation of charge collection

Sogoyan, Armen V., Chumakov, Alexander I., Smolin, Anatoly A.

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2018

Language:

english

File:

PDF, 845 KB

english, 2018

5

Prediction of Local and Global Ionization Effects on ICs: The Synergy between Numerical and Physical Simulation

V. V. Belyakov, A. I. Chumakov, A. Y. Nikiforov, V. S. Pershenkov, P. K. Skorobogatov, A. V. Sogoyan

Journal:

Russian Microelectronics

Year:

2003

Language:

english

File:

PDF, 127 KB

english, 2003

6

IC space radiation effects experimental simulation and estimation methods

A.I. Chumakov, A.T. Nikiforov, V.A. Telets, V.F. Gerasimov, A.V. Yanenko, A.V. Sogoyan

Journal:

Radiation Measurements

Year:

1999

Language:

english

File:

PDF, 154 KB

english, 1999

7

Conversion model of radiation-induced interface-trap buildup and the some examples of its application

Pershenkov, V S, Sogoyan, A V, Telets, V A

Journal:

IOP Conference Series Materials Science and Engineering

Year:

2016

Language:

english

File:

PDF, 1.08 MB

english, 2016

8

Synthesis and investigation of new materials in MIS structures for the development of physical foundations of CMOS technologies of nanoelectronics

A. V. Zenkevich, Yu. Yu. Lebedinskii, Yu. A. Matveev, N. S. Barantsev, Yu. A. Voronov, A. V. Sogoyan, V. N. Nevolin, V. I. Chichkov, S. Spiga, M. Fanchulli

Journal:

Russian Microelectronics

Year:

2010

Language:

english

File:

PDF, 459 KB

english, 2010

9

Proposed two-level Acceptor-Donor (AD) center and the nature of switching traps in irradiated MOS structures

Pershenkov, V.S., Cherepko, S.V., Sogoyan, A.V., Belyakov, V.V., Ulimov, V.N., Abramov, V.V., Shalnov, A.V., Rusanovsky, V.I.

Journal:

IEEE Transactions on Nuclear Science

Year:

1996

Language:

english

File:

PDF, 849 KB

english, 1996

10

Temperature Dependence of MCU Sensitivity in 65 nm CMOS SRAM

Boruzdina, Anna B., Sogoyan, Armen V., Smolin, Anatoly A., Ulanova, Anastasia V., Gorbunov, Maxim S., Chumakov, Alexander I., Boychenko, Dmitry V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2015

Language:

english

File:

PDF, 1.27 MB

english, 2015

11

Methods for the Prediction of Total-Dose Effects on Modern Integrated Semiconductor Devices in Space: A Review

V. V. Belyakov, V. S. Pershenkov, G. I. Zebrev, A. V. Sogoyan, A. I. Chumakov, A. Y. Nikiforov, P. K. Skorobogatov

Journal:

Russian Microelectronics

Year:

2003

Language:

english

File:

PDF, 118 KB

english, 2003

12

Modeling of High-Dose-Rate Pulsed Radiation Effects in the Parasitic MOS Structures of CMOS LSI Circuits

A. Y. Nikiforov, A. V. Sogoyan

Journal:

Russian Microelectronics

Year:

2004

Language:

english

File:

PDF, 107 KB

english, 2004

13

[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - The simulation of the low dose-rate radiation effect in bipolar devices

Pershenkov, V.S., Cherepko, S.V., Belyakov, V.V., Abramov, V.V., Rusanovsky, V.I., Sogoyan, A.V., Rogov, V.I., Ulimov, V.N., Emelianov, V.V., Nasibullin, V.S.

Year:

1998

Language:

english

File:

PDF, 320 KB

english, 1998

14

A model for the formation of leakage currents in the dielectrics of MOS structures under the effect of heavy charged particles

Sogoyan, A. V., Polunin, V. A.

Journal:

Russian Microelectronics

Year:

2015

Language:

english

File:

PDF, 300 KB

english, 2015

15

Reducing the degree of lipoid infiltration of rabbit tissues by feeding cholesterol freed from its oxidation products

A. M. Vikhert, V. N. Rozinova, A. S. Nekrasov, S. M. Sogoyan, A. K. Tikhaze, V. Z. Lankin

Journal:

Bulletin of Experimental Biology and Medicine

Year:

1987

Language:

english

File:

PDF, 1.52 MB

english, 1987

16

[IEEE 2015 International Siberian Conference on Control and Communications (SIBCON) - Omsk, Russia (2015.5.21-2015.5.23)] 2015 International Siberian Conference on Control and Communications (SIBCON) - Automated I–V measurement system for CMOS SOI transistor test structures

Shvetsov-Shilovskiy, I.I, Nekrasov, P.V., Ulanova, A.V., Smolin, A.A., Sogoyan, A.V.

Year:

2015

Language:

english

File:

PDF, 698 KB

english, 2015

17

Multichannel data-acquisition device for microclimate monitoring

A. M. Saradzhev, K. A. Sogoyan

Journal:

Measurement Techniques

Year:

1988

Language:

english

File:

PDF, 253 KB

english, 1988

18

Modeling of recombination in SiO2under the effect of ionizing radiation by the Monte Carlo method

V. A. Polunin, A. V. Sogoyan

Journal:

Russian Microelectronics

Year:

2011

Language:

english

File:

PDF, 232 KB

english, 2011

19

[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - The effect of radiation-induced reversible switching annealing

Pershenkov, V.S., Belyakov, V.V., Cherepko, S.V., Sogoyan, A.V., Rusanovschi, V.I., Sontea, V.P.

Year:

1995

Language:

english

File:

PDF, 367 KB

english, 1995

20

[IEEE 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Oxford, United Kingdom (2013.9.23-2013.9.27)] 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Compendium of SEE comparative results under ion and laser irradiation

Chumakov, Alexander I., Pechenkin, Alexander A., Savchenkov, Dmitry V., Yanenko, Andrey V., Kessarinskiy, Leonid N., Nekrasov, Pavel V., Sogoyan, Armen V., Tararaksin, Alexander I., Vasil'ev, Alexey L

Year:

2013

Language:

english

File:

PDF, 1.28 MB

english, 2013

21

The impact of laser polarization direction on local dose rate effects simulation for modern integrated circuits

Skorobogatov, P. K., Sogoyan, A. V., Davydov, G. G., Egorov, A. N., Savchenkov, D. V.

Journal:

Russian Microelectronics

Year:

2015

Language:

english

File:

PDF, 2.55 MB

english, 2015

22

Evaluation of resistance of CMOS LSIC to the factor of absorbed dose under the pulsed radiation effect

Journal:

Russian Microelectronics

Year:

2011

Language:

english

File:

PDF, 490 KB

english, 2011

23

Features of charge formation and relaxation in SOS structures under the effect of ionizing radiation

A. V. Sogoyan, G. G. Davydov

Journal:

Russian Microelectronics

Year:

2011

Language:

english

File:

PDF, 661 KB

english, 2011

24

[IEEE 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Moscow, Russia (2015.9.14-2015.9.18)] 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Modeling Charge Buildup in Deposited Oxides under X-Ray and Gamma Irradiation

Smolin, Anatoly A., Sogoyan, Armen V., Ulanova, Anastasia V., Demidov, Alexander A.

Year:

2015

Language:

english

File:

PDF, 331 KB

english, 2015

25

Somatic Mutations in Gene MED 12 among Women with the Family History of Uterine Fibroids

Sogoyan, N.S., Kuzneysova, M.V., Trofimov, D.Y., Adamyan, L.V., Stepanian, A.A.

Journal:

Journal of Minimally Invasive Gynecology

Year:

2017

Language:

english

File:

PDF, 253 KB

english, 2017

26

[IEEE 2017 IEEE 30th International Conference on Microelectronics (MIEL) - Nis (2017.10.9-2017.10.11)] 2017 IEEE 30th International Conference on Microelectronics (MIEL) - Total ionizing dose hardness nondestructive individual estimation and predictive grading for silicon-on-insulator ICs

Moskovskaya, Y.M., Davydov, G.G., Sogoyan, A.V., Nikiforov, A.Y., Yashanin, I.B.

Year:

2017

Language:

english

File:

PDF, 1.21 MB

english, 2017

27

Morphological and histochemical changes in postvaccinal immunogenesis

I. S. Sogoyan, A. V. Perkelyan

Journal:

Bulletin of Experimental Biology and Medicine

Year:

1967

Language:

english

File:

PDF, 395 KB

english, 1967

28

Effect of aging on radiation response of bipolar transistors

Pershenkov, V.S., Slesarev, A.Y., Sogoyan, A.V., Belyakov, V.V., Kekukh, V.B., Bashin, A.Y., Ivashin, D.V., Motchkine, V.S., Ulimov, V.N., Emelianov, V.V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2001

Language:

english

File:

PDF, 103 KB

english, 2001

29

[IEEE 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Moscow, Russia (2015.9.14-2015.9.18)] 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - The Experimental and Simulation Study of Specialized Thermal Control Coating Application for Radiation Shielding of Electronic Components

Anashin, Vasily S., Protopopov, Grigory A., Kozyukova, Olga S., Lyakhov, Igor A., Zinchenko, Vladimir F., Grigorevskiy, Anatoly V., Khasanshin, Rashid H., Sogoyan, Armen V.

Year:

2015

Language:

english

File:

PDF, 433 KB

english, 2015

30

The effect of emitter junction bias on the low dose-rate radiation response of bipolar devices

Pershenkov, V.S., Maslov, V.B., Cherepko, S.V., Shvetzov-Shilovsky, I.N., Belyakov, V.V., Sogoyan, A.V., Rusanovsky, V.I., Ulimov, V.N., Emelianov, V.V., Nasibullin, V.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1997

Language:

english

File:

PDF, 851 KB

english, 1997

31

[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Radiation Response of Bipolar Transistors at Various Irradiation Temperatures and Electric Biases: Modeling and Experiment

Zebrev, G. I., Pavlov, D. Y., Pershenkov, V. S., Nikiforov, A. Y., Sogoyan, A. V., Boychenko, D. V., Ulimov, V. N., Emelyanov, V. V.

Year:

2005

Language:

english

File:

PDF, 1.19 MB

english, 2005

32

Effect of oxidation products of cholesterol, polyunsaturated fatty acids, and the synthetic antioxidant ionol on experimental hypercholesterolemia in rabbits

S. M. Sogoyan, V. Z. Lankin, L. G. Rodina, V. N. Ivanov, I. K. Filippov, I. S. Azhgikhin, A. M. Vikhert

Journal:

Bulletin of Experimental Biology and Medicine

Year:

1984

Language:

english

File:

PDF, 262 KB

english, 1984

33

Method of radiational identification of a plant and characterization of integrated circuit technology

Sogoyan, A. V., Davydov, G. G., Artamonov, A. S., Kolosova, A. S., Telets, V. A., Nikiforrov, A. Yu., Ozhegin, Yu. A., Kameneva, A. S., Moskovskaya, Yu. M.

Journal:

Russian Microelectronics

Year:

2017

Language:

english

File:

PDF, 593 KB

english, 2017

34

[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Thermal and field dependencies of latent relaxation processes in irradiated MOS devices

Emelianov, V.V., Sogoyan, A.V., Cherepko, S.V., Meshurov, O.V., Ulimov, V.N., Chumakov, A.I., Rogov, V.I., Nikiforov, A.Y.

Year:

1998

Language:

english

File:

PDF, 424 KB

english, 1998

35

The hydrogenic-electron model of accumulation of surface states on the oxide-semiconductor interface under the effects of ionizing radiation

Sogoyan, A. V., Cherepko, S. V., Pershenkov, V. S.

Journal:

Russian Microelectronics

Year:

2014

Language:

english

File:

PDF, 156 KB

english, 2014

36

[IEEE 2014 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2014) - Paris, France (2014.7.14-2014.7.18)] 2014 IEEE Radiation Effects Data Workshop (REDW) - Compendium of TID Comparative Results under X-Ray, Gamma and LINAC Irradiation

Kessarinskiy, Leonid N., Boychenko, Dmitry V., Petrov, Andrey G., Nekrasov, Pavel V., Sogoyan, Armen V., Anashin, Vasily S., Chubunov, Pavel A.

Year:

2014

Language:

english

File:

PDF, 478 KB

english, 2014

37

[IEEE 2016 International Siberian Conference on Control and Communications (SIBCON) - Moscow, Russia (2016.5.12-2016.5.14)] 2016 International Siberian Conference on Control and Communications (SIBCON) - The automated system for parametric characterization of the input and output blocks in digital ICs

Davydov, G. G., Kolosova, A. S., Sogoyan, A. V., Artamonov, A. S., Boychenko, D. V.

Year:

2016

Language:

english

File:

PDF, 862 KB

english, 2016

38

Rheological properties of polymethyl mechacrylate blends with elastomers as a function of thermodynamic interaction of the components and the degree of blend dispersion

L.V. Vershinin, Yu.G. Yanovskii, V.N. Kuleznev, V.V. Barancheyeva, A.S. Levasheva, K.A. Sogoyan

Journal:

Polymer Science U.S.S.R.

Year:

1988

Language:

english

File:

PDF, 432 KB

english, 1988

39

Effect of electron traps on reversibility of annealing

Pershenkov, V.S., Belyakov, V.V., Cherepko, S.V., Nikiforov, A.Y., Sogoyan, A.V., Ulimov, V.N., Emelianov, V.V.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 881 KB

english, 1995

40

EAS electron and muon distributions and size spectra from the GAMMA installation

Eganov, V S, Garyaka, A P, Korkotian, E V, Mamidjanian, E A, Martirosov, R M, Procureur, J, Sogoyan, H E, Zazyan, M Z

Journal:

Journal of Physics G Nuclear and Particle Physics

Year:

2000

Language:

english

File:

PDF, 451 KB

english, 2000

41

[IEEE RADECS 2001. 2001 6th European Conference on Radiation and its Effects on Components and Systems - Grenoble, France (10-14 Sept. 2001)] RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) - Single-chip pressure sensor radiation hardness research

Artamonov, A.S., Boychenko, D.V., Nikiforov, A.Y., Sogoyan, A.V., Shelepin, N.A., Telets, V.A., Tverskoy, M.G.

Year:

2002

Language:

english

File:

PDF, 187 KB

english, 2002

42

The Impact of the Polarization Orientation on Laser SEE Modeling in Complex ICs

Skorobogatov, Petr K., Sogoyan, Armen V., Davydov, Georgii G., Egorov, Andrey N., Savchenkov, Dmitriy V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2015

Language:

english

File:

PDF, 3.20 MB

english, 2015

43

[IEEE 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) - Beijing, China (2018.5.16-2018.5.18)] 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) - Single Event Rate Prediction Method for Advanced CMOS Technologies

Sogoyan, Armen V., Chumakov, Alexander I., Smolin, Anatoly A.

Year:

2018

File:

PDF, 3.07 MB

2018

44

Monitoring condensate deposition from stack gases

K. A. Sogoyan, A. A. Sharkhatunyan, V. F. Mandrokhlebov

Journal:

Measurement Techniques

Year:

1982

Language:

english

File:

PDF, 142 KB

english, 1982

45

Radiation Response of Bipolar Transistors at Various Irradiation Temperatures and Electric Biases: Modeling and Experiment

Zebrev, G.I., Pavlov, D.Y., Pershenkov, V.S., Nikiforov, A.Y., Sogoyan, A.V., Boychenko, D.V., Ulimov, V.N., Emelyanov, V.V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 538 KB

english, 2006

46

Method for online nondestructive hardness assurance for CMOS LSI circuits realized in SOS technology

G. G. Davydov, A. V. Sogoyan, A. Y. Nikiforov, A. V. Kirgizova, A. G. Petrov, A. Y. Sedakov, I. B. Yashanin

Journal:

Russian Microelectronics

Year:

2008

Language:

english

File:

PDF, 259 KB

english, 2008

47

[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Thermal- and radiation-induced interface traps in MOS devices

Sogoyan, A.V., Cherepko, S.V., Pershenkov, V.S., Rogov, V.I., Ulimov, V.N., Emelianov, V.V.

Year:

1998

Language:

english

File:

PDF, 390 KB

english, 1998

48

[IEEE 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Moscow, Russia (2015.9.14-2015.9.18)] 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Multiple Cell Upset Mechanisms in SRAMs

Chumakov, Alexander I., Sogoyan, Armen V., Boruzdina, Anna B., Smolin, Anatoly A., Pechenkin, Alexander A.

Year:

2015

Language:

english

File:

PDF, 374 KB

english, 2015

49

The investigation of the radiation behavior of cells of energy-independent electrically reprogrammable memory based on self-formed conducting nanostructures. I. Mode of information storage

V. M. Mordvintsev, A. V. Sogoyan, S. E. Kudryavtsev, V. L. Levin

Journal:

Russian Microelectronics

Year:

2011

Language:

english

File:

PDF, 333 KB

english, 2011

50

[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Radiation effects in piezoelectric sensor

Boychenko, D.V., Nikiforov, A.Y., Skorobogatov, P.K., Sogoyan, A.V.

Year:

2007

Language:

english

File:

PDF, 2.17 MB

english, 2007

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